
Product Details
| Model | Evolution 220 |
| Brand | THERMO SCIENTIFIC |
| Category | Spectrophotometer |
| Posted | 16.02.2026 |
| Views | 313 |
Used THERMO SCIENTIFIC Evolution 220
Condition:: Used
Shipping from::
USA
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Description
Empower your analysis and bring versatility and productivity to your lab with the Thermo Scientific Evolution 220 UV-Vis system. For routine to research analysis, this instrument series offers real innovations that provide enhanced usability and performance – without added complexity. With straightforward software, cutting-edge instrumentation and a wide selection of accessories, the Evolution 220 system works with you to perform experiments the way you want – for the results you need.
Performance Specifications:
Optical Design: Double-beam with sample and reference cuvette positions; Application Focused Beam Geometry; Czerny-TurnerMonochromator
Spectral bandwidths: Variable: 1.0 nm; 2.0 nm; AFBG Microcell optimized; AFBG Fiber optic optimized; AFBG Materials optimized
Light source: Xenon Flash Lamp
Detector: Dual Silicon Photodiodes
Scan ordinate modes: Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs*Factor, Intensity
Wavelength: Range: 190-100 nm; Accuracy: ±0.5 nm (541.9, 546.1 nm mercury lines) ±0.8 nm (full range 190–1100 nm); Repeatability: ≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)
Scanning speed: 3.5 A; Display Range: -0.3 to 4.0 A; Accuracy – Instrument: 1A: ±0.004 A, 2A: ±0.008 A, Measured at 440 nm using neutral density filters traceable to NIST; Noise: 0A: ≤0.00015 A 1A: ≤0.00025 A 2A: ≤0.00080 A 260 nm, 1.0 nm SBW, RMS; Drift (Stability):
Performance Specifications:
Optical Design: Double-beam with sample and reference cuvette positions; Application Focused Beam Geometry; Czerny-TurnerMonochromator
Spectral bandwidths: Variable: 1.0 nm; 2.0 nm; AFBG Microcell optimized; AFBG Fiber optic optimized; AFBG Materials optimized
Light source: Xenon Flash Lamp
Detector: Dual Silicon Photodiodes
Scan ordinate modes: Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs*Factor, Intensity
Wavelength: Range: 190-100 nm; Accuracy: ±0.5 nm (541.9, 546.1 nm mercury lines) ±0.8 nm (full range 190–1100 nm); Repeatability: ≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)
Scanning speed: 3.5 A; Display Range: -0.3 to 4.0 A; Accuracy – Instrument: 1A: ±0.004 A, 2A: ±0.008 A, Measured at 440 nm using neutral density filters traceable to NIST; Noise: 0A: ≤0.00015 A 1A: ≤0.00025 A 2A: ≤0.00080 A 260 nm, 1.0 nm SBW, RMS; Drift (Stability):
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