New JEOL JSM-7400F

Ends 03/13 - To see full details and additional photos please contact us at marketing@govdeals.com with QAL#6794-6063

Location: Seattle, Washington

The University of Washington Surplus Property program is pleased to offer this JEOL JSM-7400F field emission scanning electron microscope. The JEOL JSM7400F is a scanning electron microscope (SEM) using advanced electron optical equipment. This tool is a reliable workhorse, capable of providing detailed, high magnification images. This system is suitable for a wide array of applications, though it is best suited for semiconductor research and related fields. This is a great SEM for those who like to be more hands-on in their imaging sessions. The JSM7400F features a chamber that is able to accommodate a variety of holders, all the way up to a 4” silicon wafer. The tool comes equipped with a load lock, an upgraded sample transfer system, and manual height and tilt control. This SEM features a cold field emission gun (FEG) that offers steady beam conditions over long imaging sessions. The JSM7400F is capable of high-quality images to be taken at low working distances and high magnification. The column is outfitted with optics for normal secondary electron emission, as well as optics for detecting backscattered electrons. Comes with JEOL software on Dell workstation (Dell, WHL, 67MXM41, Xeon CPU 2.40 GHz, 512 MB RAM). Also includes internal chamber camera and ion pump battery backup, and a variety of sample stages will go with the tool, including a 4” wafer holder and cross-section/angled view holder.

This equipment is actively used, regularly serviced by OEM, and in excellent working order. A demonstration can be arranged if desired. The tool has been operating in a cleanroom environment, imaging dry, intact semiconductor samples, and so is very clean.